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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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Book ID Asin: 3540639764
Book Title: Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)
Book Author: Ludwig Reimer,P.W. Hawkes
Book Format and Price:
Book Format Name: Hardcover
Book Format Price: $164.47-$299.99
Book Format Name: Paperback
Book Format Price: $161.99
Book Price: $299.99
Book Category: Books, Engineering & Transportation, Engineering and unknown
Book Rating: 4 ratings
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45) by Ludwig Reimer,P.W. Hawkes Book Review
Name: Makoto Suzuki
Rating: 5.0 out of 5 stars
Title: A very good book
Date: Reviewed in the United States 🇺🇸 on July 21, 2008
Review: This is one of the self-complete books on SEM and the related techniques for intermediate and advanced level of the SEM users or engineers.
With a huge list of references, the book explains almost all of the details of instrumentation, electron beam optics, detector strategy, physics of electron-specimen interaction, and practical applications of SEM-based imaging/analyzing techniques.
While some of the references cited are German literatures, the book provides the best guide for the SEM techniques and the underlyiong physics
for wide range of readers.
I recommend it.
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